Surface Oxidation and Reduction of CuO and Cu2O Studied Using XPS and XAES

Stephen Poulston, Peter M. Parlett, Phillip J. Stone, Michael Bowker

Surface and Interface Analysis · 1996 · 1.1K citations · 22 references

Concepts

TL;DR

XPS and X‑ray‑excited Auger electron spectroscopy were used to monitor surface composition changes of CuO and Cu₂O during vacuum annealing, oxidation, and hydrogen reduction, including reoxidation by heating at 800 K in 1×10⁻⁴ mbar O₂ and regeneration by vacuum annealing at the same temperature. Prolonged annealing of CuO produced a thick Cu₂O surface layer, vacuum annealing of Cu₂O yielded a thin Cu metal film, and both oxides reduced to surface metal when heated in 1×10⁻⁴ mbar H₂ at 400 K, with the extent of reduction depending on prior thermal history, while hydrogen‑reduced samples reoxidized upon vacuum annealing, demonstrating lattice‑oxygen diffusion.

Abstract

Using XPS and x-ray-excited Auger electron spectroscopy (XAES), we have studied the variation in surface composition of CuO and Cu2O with a variety of high-vacuum treatments, including vacuum annealing, oxidation and hydrogen reduction. Prolonged annealing of CuO results in the formation of a thick layer of Cu2O at the surface whilst vacuum annealing of Cu2O produces a thin (possibly one monolayer) film of Cu metal. Both bulk Cu2O and the thick Cu2O film generated from vacuum-annealed CuO were oxidized to CuO by heating at 800 K in 1×10-4 mbar O2, the original surface being regenerated with vacuum annealing at the same temperature. Both CuO and Cu2O are reduced to metal at the surface by heating in 1×10-4 mbar hydrogen at 400 K. In the case of CuO, the extent of reduction varies with the thermal history of the sample, with prolonged vacuum annealing producing a more reducible surface. Hydrogen-reduced CuO and Cu2O were both reoxidized on vacuum annealing, demonstrating the diffusion of lattice oxygen to the surface.

References

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