Node-fault diagnosis and a design of testability

Abstract

A concept of <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">k</tex> -node-fault testability is introduced. A sufficient and almost necessary condition for testability as well as the test procedure is presented. This condition is further evolved to a necessary and almost sufficient topological condition for testability. A unique feature of this condition is that it depends only on the graph of the circuit, not on the element values. Based on this condition, a design of testability can be established.