IEEE Transactions on Magnetics · 1996 · 11 citations · 4 references
EngineeringElectrical EngineeringInstrumentationMetrologyMicrofabricationMagnetic CharacterizationMagnetic Recording MaterialsMagnetic SensorsMagnetic Thin FilmsThin Film Magnetic PropertiesDisplacementMagnetization MeasurementMagnetometer InstrumentationMagnetometer MeasurementsSignal-to-noise AnalysisSignal-to-noise RatioSignal-to-noise ReductionTape Measurements
We report a new technique for measurement of crosstrack profiles of magnetoresistive (MR) read elements in tape heads. This method minimizes errors due to tape tracking and quickly delivers crosstrack profiles with good signal-to-noise ratios. In this technique the read element is located downstream from the write head in a typical tape head configuration. AC erased tape is passed over the head and the write head is turned on. The profile of the read element is scanned by changing the lateral position of the read element relative to the write head by varying the azimuth angle between the head and tape with a positioner. Offtrack position is calculated from the linear displacement of the positioner used to generate the azimuth angle. The measurement technique is well suited for characterizing MR read heads for tape servo applications and for examining performance reliability and repeatability.
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