Measurement of the microwave structure constant profile

Abstract

Measurements of the microstructure of refractivity at 9.4 GHz were made in Colorado and Florida up to altitudes of about 29000 ft. The structure function parameter <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">C_{n}^{2}</tex> was calculated from these data. Examples of the resulting profiles are presented with corresponding profiles of refractivity and temperature. Values of <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">C_{n}^{2}</tex> varied from about <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">10^{-13}</tex> to <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">10^{-17}</tex> m <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">-2/3</sup> . The heights of occurrence of maximum and minimum values are summarized.