Concepedia

XPS/NRA investigations of particle size effects during the oxidation of Cu particles supported on oxidised Si (100)

R. van Wijk, P.C. Görts, A.J.M. Mens, O.L.J. Gijzeman, F.H.P.M. Habraken, J.W. Geus

Applied Surface Science · 1995 · 24 citations · 21 references

DOI

Concepts

References

21

Quantitative electron spectroscopy of surfaces: A standard data base for electron inelastic mean free paths in solids

M. P. Seah, W. A. Dench · Surface and Interface Analysis · 1979 · 5.3K citations

, , +17

<i>Ellipsometry and Polarized Light</i>

R. M. A. Azzam, N. M. Bashara, Stanley S. Ballard · Physics Today · 1978 · 4.3K citations

, , +13

Practical surface analysis

Vacuum · 1994 · 3.3K citations

Algorithms for the rapid simulation of Rutherford backscattering spectra

Lawrence Doolittle · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 1985 · 2.8K citations

, , +10

The Evolution of Silicon Wafer Cleaning Technology

Werner Kern · Journal of The Electrochemical Society · 1990 · 1.7K citations

, , +17