Quantitative diffractometry at 0.1 nm resolution for testing lenses and recording media of a high-voltage atomic resolution microscope

Abstract

Journal Article Quantitative diffractometry at 0.1 nm resolution for testing lenses and recording media of a high–voltage atomic resolution microscope Get access G. Möbus, G. Möbus Max-Planck-Institut für MetallforschungSeestraβe 92, D-70174 Stuttgart, Germany Search for other works by this author on: Oxford Academic PubMed Google Scholar F. Phillipp, F. Phillipp Max-Planck-Institut für MetallforschungSeestraβe 92, D-70174 Stuttgart, Germany Search for other works by this author on: Oxford Academic PubMed Google Scholar T. Gemming, T. Gemming Max-Planck-Institut für MetallforschungSeestraβe 92, D-70174 Stuttgart, Germany Search for other works by this author on: Oxford Academic PubMed Google Scholar R. Schweinfest, R. Schweinfest Max-Planck-Institut für MetallforschungSeestraβe 92, D-70174 Stuttgart, Germany Search for other works by this author on: Oxford Academic PubMed Google Scholar M. Rühle M. Rühle Max-Planck-Institut für MetallforschungSeestraβe 92, D-70174 Stuttgart, Germany Search for other works by this author on: Oxford Academic PubMed Google Scholar Journal of Electron Microscopy, Volume 46, Issue 5, 1997, Pages 381–395, https://doi.org/10.1093/oxfordjournals.jmicro.a023534 Published: 01 January 1997 Article history Published: 01 January 1997 Received: 25 February 1997 Accepted: 02 July 1997