XPS characterization of nitrogen‐doped carbon nanotubes

Abstract

Abstract In this work, CNTs have been bombarded with low energy N ions. X‐ray photoelectron spectroscopy have been used to determine the binding configuration of the N‐doped CNTs. AFM was also used to determine their morphology and mechanical properties. The same morphology is maintained after the N 2 + bombardment. XPS analysis shows that the N 1s core level spectra for N‐doped CNTs can be deconvoluted in terms of two peaks related to sp 2 (C–N=C) and sp 3 hybridization (C–N configuration). This interpretation is in concordance with the increase of the hardness observed by AFM nanoindentations when the sp 3 contributions increase. (© 2006 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)