Publication | Closed Access
Ptychographic characterization of the wavefield in the focus of reflective hard X-ray optics
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Citations
22
References
2010
Year
EngineeringPhysicsMicroscopyOptical PropertiesX-ray DiffractionApplied PhysicsDiffractionCrystallographyPtychographic CharacterizationReflectanceX-ray Optic
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