Analysis of the Spur Characteristics of Edge-Combining DLL-Based Frequency Multipliers

Abstract

A complete analysis of the spur characteristics of edge-combining delay-locked loop (DLL)-based frequency multipliers is presented in this brief. The novelty of this analysis is the fact that it can be used to estimate the effect of both the in-lock error and the delay-stage mismatch on the spurious level of the frequency multiplier with low computational complexity. In addition, a way to reduce the mismatch between the delay cells in the delay line is discussed via an analytic model and verified by the implementation of a delay cell in a 65-nm CMOS process.