Neutron and X-ray Reflectometry: Solid Multilayers and Crumpling Films

Abstract

The structures of films and interfaces at the molecular level can be determined from specular reflectivity measurements using neutrons and X-rays. A general introduction to the principles of neutron and X-ray reflectometry is given. Illustrative examples of the application of neutron and X-ray reflectometry to problems of chemical and physical interest are presented.