Interfacial segregation at Cu-rich precipitates in a high-strength low-carbon steel studied on a sub-nanometer scale

Quantitative size-factors for metallic solid solutions

H. W. King · Journal of Materials Science · 1966 · 853 citations

Materials Science, Materials Engineering, Engineering +5

Analysis of Three-dimensional Atom-probe Data by the Proximity Histogram

Olof C. Hellman, Justin A. Vandenbroucke, Järg Rüsing et al. · Microscopy and Microanalysis · 2000 · 795 citations

Field Ion Microscopy, Principles and Applications

Peter H. Bartels, Erwin W. Müller, Tien T. Tsong · Transactions of the American Microscopical Society · 1970 · 617 citations

Electron Microscopy, Physics, Microscopy +6

Trajectory overlaps and local magnification in three-dimensional atom probe

F. Vurpillot, A. Bostel, D. Blavette · Applied Physics Letters · 2000 · 437 citations

Second Phase, Engineering, Nuclear Physics +18

High-resolution electron microscopy studies of the structure of Cu precipitates in α-Fe

P. J. Othen, M. L. Jenkins, George David Smith · Philosophical magazine. A/Philosophical magazine. A. Physics of condensed matter. Structure, defects and mechanical properties · 1994 · 432 citations

Materials Science, Magnetic Properties, Cu Precipitation +12