Economic Impact of Type I Test Errors at System and Board Levels

Abstract

The economic impact of Type I test errors that fail good product in electronic systems and PC boards is evaluated. Data show that an average of 46 percent of all valid component failures at the board and system level are, in fact, not failures. Data are given in several formats and a model is presented showing the impact on quality of bonepile testing. A model that predicts the impact on quality of bonepile testing is presented. This model is used to predict quality impact for three different cases. The data also show that accurate diagnostic techniques should be designed into the product.