Harmony: static noise analysis of deep submicron digital integrated circuits

Abstract

As technology scales into the deep submicron regime, noise immunity is becoming a metric of comparable importance to area, timing, and power for the analysis and design of very large scale integrated (VLSI) systems. A metric for noise immunity is defined, and a static noise analysis methodology based on this noise-stability metric is introduced to demonstrate how noise can be analyzed systematically on a full-chip basis using simulation-based transistor-level analysis. We then describe Harmony, a two-level (macro and global) hierarchical implementation of static noise analysis. At the macro level, simplified interconnect models and timing assumptions guide efficient analysis. The global level involves a careful combination of static noise analysis, static timing analysis, and detailed interconnect macromodels based on reduced-order modeling techniques. We describe how the interconnect macromodels are practically employed to perform coupling analysis and how timing constraints can be used to limit pessimism in the analysis.