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Comparison of quasi-static and non-quasi-static capacitance models for the four-terminal MOSFET
13
Citations
9
References
1987
Year
Device ModelingElectrical EngineeringEngineeringAnalytic ComparisonBias Temperature InstabilityBulk Charge EffectFour-terminal MosfetNon-quasi-static Capacitance ModelsPower ElectronicsMicroelectronicsCircuit Simulation
Analytic comparison of quasi-static and non-quasi-static capacitance models is performed for the four-terminal MOSFET with the bulk charge effect included under all operating regimes (weak, moderate, and strong inversion). It is shown that, with the use of a linearized bulk charge density, the Ward quasi-static charge-based approach [2] is equivalent to the non-quasi-static solution [5] in terms of the capacitances calculated at low frequencies. Such a mathematical link between the two approaches may be crucial toward developing high-frequency models for transient analysis.
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