IEEE Electron Device Letters · 1987 · 13 citations · 9 references
EngineeringElectrical EngineeringCircuit TheoryMicroelectronicsSemiconductor DevicesCmos Circuit DesignCurrent DistributionCurrent-voltage CharacteristicsDevice ModelingShort-channel EffectsTransient AnalysisBulk DensityCapacitance EstimationCapacitance ModelingCarrier Transport At High FrequencyDifferential CapacitanceMosfet ModelingNonideal Capacitance EffectsTransient Device Modeling
Analytic comparison of quasi-static and non-quasi-static capacitance models is performed for the four-terminal MOSFET with the bulk charge effect included under all operating regimes (weak, moderate, and strong inversion). It is shown that, with the use of a linearized bulk charge density, the Ward quasi-static charge-based approach [2] is equivalent to the non-quasi-static solution [5] in terms of the capacitances calculated at low frequencies. Such a mathematical link between the two approaches may be crucial toward developing high-frequency models for transient analysis.
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MOS models and circuit simulations
Johannes Meyer · Medical Entomology and Zoology · 1971 · 202 citations
Engineering, Computer Engineering, Electrical Engineering +14