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Measurement of the absorption edge of thick transparent substrates using the incoherent reflection model and spectroscopic UV–visible–near IR ellipsometry

Materials ScienceOptical MaterialsEngineeringOptical PropertiesSpectroscopyApplied PhysicsThick Transparent SubstratesAbsorption SpectroscopyOptical SpectroscopyAbsorption EdgeLight AbsorptionIncoherent Reflection ModelReflectanceUv-vis Spectroscopy