Nonlinear device noise models: Satisfying the thermodynamic requirements

Abstract

This paper proposes three tests to determine whether a given nonlinear device noise model is in agreement with accepted thermodynamic principles. These tests are applied to several models. One conclusion is that the standard Gaussian noise models for nonlinear devices predict thermodynamically impossible circuit behavior: those models should be abandoned. But the nonlinear shot-noise model predicts thermodynamically acceptable behavior under a constraint derived here. Further, this constraint specifies the current noise amplitude at each operating point from knowledge of the device /spl upsi/-i curve alone. This paper shows how the thermodynamic requirements can be reduced to concise mathematical tests, involving no approximations, for the Gaussian and shot-noise models.