IEEE Transactions on Microwave Theory and Techniques · 1996 · 25 citations · 5 references
EngineeringElectrical EngineeringMicroelectronicsMicrowave EngineeringSemiconductor DevicesField-effect TransistorsIntegrated Circuit DesignMetal-oxide-semiconductor Field-effect TransistorsMicrowave Integrated CircuitsMicrowave Semiconductor DevicesRadio-frequency Integrated CircuitsInductance CalculationInductive CircuitsInductor DesignMicrowave Integrated Circuit DesignMillimeter-wave Integrated CircuitsMonolithic Microwave Integrated Circuit DesignMonolithic Microwave Integrated CircuitsSelf-inductance
An original method for the determination of all possible inductive circuits as a function of the number of field-effect transistors (FETs) used is described in this paper. The method is of general use in monolithic microwave integrated circuits. Circuits with large inductance, either positive or negative in value, can be obtained along with low loss or even negative resistance.
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