A stabilized resistive voltage source for FDTD thin-wire models

Abstract

The von Neumann analysis is applied to investigate the stability of a source connected on a wire described by a thin-wire model. Both a soft source and a resistive voltage source (RVS) are shown to limit the stable range of values for wire radius or time step. Using the von Neumann analysis, a stable RVS model for thin wires is developed. The proposed model is verified by comparison with a hard source, an original RVS and NEC-generated reference data. The stabilized RVS introduces no additional stability constraints on those of the wire model while maintaining fast decay of incident fields of the original RVS model.