High-speed crystal detection and characterization using a fast-readout detector

Abstract

A novel raster-scanning method combining continuous sample translation with the fast readout of a Pilatus P6M detector has been developed on microfocus beamline I24 at Diamond Light Source. This fast grid-scan tool allows the rapid evaluation of large sample volumes without the need to increase the beam size at the sample through changes in beamline hardware. A slow version is available for slow-readout detectors. Examples of grid-scan use in centring optically invisible samples and in detecting and characterizing numerous microcrystals on a mesh-like holder illustrate the most common applications of the grid scan now in routine use on I24.