X-ray Diffraction Detection

X-Ray Diffraction Detection is a scientific method within the field of X-ray detection that identifies the structural composition of crystalline materials by analyzing the characteristic diffraction patterns produced when X-rays interact with atomic lattices.

526

Publications

22.1K

Citations

2.6K

Authors

768

Institutions

Publications per year

2017–2026

134

Authors

2.6K

  1. SM
    Sol M. Grüner

    Cornell University, United States

    9 publications · 280 citations

    9

    h-index

  2. JR
    James R. Milch

    Princeton University, United States

    5 publications · 120 citations

    5

    h-index

  3. IN
    I. Náday

    Argonne National Laboratory, United States

    5 publications · 87 citations

    5

    h-index

  4. PM
    P. M. Rentzepis

    University of California, Irvine, United States

    4 publications · 116 citations

    4

    h-index

  5. TS
    Toshihiko Sasaki

    Kanazawa University, Japan

    4 publications · 112 citations

    4

    h-index

1–5 of 2.6K

Venues

  1. Review of Scientific Instruments

    29 publications · 1.1K citations

    20

    h-index

  2. Journal of Synchrotron Radiation

    24 publications · 1.3K citations

    18

    h-index

  3. Journal of Applied Crystallography

    24 publications · 1.1K citations

    16

    h-index

  4. 11

    h-index

  5. Journal of Applied Physics

    7 publications · 263 citations

    7

    h-index

1–5