Publication | Closed Access
A numerical study of Auger recombination in bulk InGaN
89
Citations
28
References
2010
Year
Wide-bandgap SemiconductorEngineeringDirect InterbandNanoelectronicsNumerical SimulationBulk InganMaterials EngineeringElectrical EngineeringPhysicsExperimental AnalysisAluminum Gallium NitrideSemiconductor Device FabricationFermi StatisticsMicroelectronicsCategoryiii-v SemiconductorProcess IntensificationSolid-state LightingApplied PhysicsGan Power DeviceOptoelectronics
Direct interband and intraband Auger recombination due to electron-electron-hole and hole-hole-electron transitions in bulk InGaN is investigated by first-order perturbation theory including Fermi statistics, realistic electronic structures obtained by nonlocal empirical pseudopotential calculations, and their corresponding wavevector-dependent dielectric functions. Our results confirm that the intraband Auger coefficient is negligible in alloy compositions relevant for solid-state lighting and indicate that the resonant enhancement associated with interband transitions for wavelengths ranging from blue to green cannot account for the efficiency droop experimentally observed in GaN-based light emitting diodes.
| Year | Citations | |
|---|---|---|
Page 1
Page 1