Publication | Closed Access
XPS characterisation of in situ treated lanthanum oxide and hydroxide using tailored charge referencing and peak fitting procedures
583
Citations
63
References
2011
Year
Materials ScienceMaterials EngineeringTailored Charge ReferencingEngineeringOxidation ResistanceOxide ElectronicsXps CharacterisationGallium OxideChemistryElectrochemical ProcessLanthanum OxideElectrochemistry
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