Accurate miscut angle determination for spherically bent Bragg crystals

Abstract

Spherically bent crystals are used as analyzers in high-resolution spectroscopy, in particular, in low count-rate applications such as exotic-atom research. The focal conditions are determined not only by the bending radius and the Bragg angle but also by the crystal cut angle between its surface and the reflecting crystal planes, along with their orientation with respect to the direction of dispersion. We describe a simple but precise method for measuring the cut angle and its orientation for mounted spherically bent crystals, by combining x-ray diffraction and laser optical alignment, which can be easily performed with standard x-ray laboratory equipment.