Publication | Closed Access
A versatile system for ultrahigh resolution, low temperature, and polarization dependent Laser-angle-resolved photoemission spectroscopy
145
Citations
25
References
2008
Year
EngineeringSpectroscopic PropertyPolarization Dependent LaserLow TemperatureOptical PropertiesSuperconductivityInfrared OpticVersatile SystemOptical SpectroscopyMaterials SciencePhotonicsPhysicsInfrared SpectroscopyLaser SpectroscopyTantalum MetalPhotoelectric MeasurementSynchrotron RadiationUltrahigh ResolutionNatural SciencesSpectroscopyApplied PhysicsOptoelectronicsSpectroscopic Method
We have developed a low temperature ultrahigh resolution system for polarization dependent angle-resolved photoemission spectroscopy (ARPES) using a vacuum ultraviolet (vuv) laser (hnu=6.994 eV) as a photon source. With the aim of addressing low energy physics, we show the system performance with angle-integrated PES at the highest energy resolution of 360 mueV and the lowest temperature of 2.9 K. We describe the importance of a multiple-thermal-shield design for achieving the low temperature, which allows a clear measurement of the superconducting gap of tantalum metal with a T(c)=4.5 K. The unique specifications and quality of the laser source (narrow linewidth of 260 mueV, high photon flux), combined with a half-wave plate, facilitates ultrahigh energy and momentum resolution polarization dependent ARPES. We demonstrate the use of s- and p-polarized laser-ARPESs in studying the superconducting gap on bilayer-split bands of a high T(c) cuprate. The unique features of the quasi-continuous-wave vuv laser and low temperature enables ultrahigh-energy and -momentum resolution studies of the spectral function of a solid with large escape depth. We hope the present work helps in defining polarization dependent laser excited angle-resolved photoemission spectroscopy as a frontier tool for the study of electronic structure and properties of materials at the sub-meV energy scale.
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