Control of the initial stage of nanocrystallite silicon growth monitored by in-situ spectroscopic ellipsometry - Concepedia

Concepedia

Publication | Closed Access

Control of the initial stage of nanocrystallite silicon growth monitored by in-situ spectroscopic ellipsometry

33

Citations

8

References

1997

Year

Hajime Shirai, Takeshi Arai, Takuya Nakamura

Applied Surface Science

Materials ScienceIn-situ Spectroscopic EllipsometryInitial StageEngineeringNanomaterialsNanotechnologySurface ScienceApplied PhysicsSiliceneNanometrologyNanoscale ScienceNanocrystalline MaterialSilicon On InsulatorNanocrystallite Silicon Growth

References

	Year	Citations

Page 1