Real-time application of critical dimension measurement of TFT-LCD pattern using a newly proposed 2D image-processing algorithm - Concepedia

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Real-time application of critical dimension measurement of TFT-LCD pattern using a newly proposed 2D image-processing algorithm

22

Citations

17

References

2008

Year

Jeongho Lee, You-Sik Kim, Sung-Ryoung Kim, Il-Hwan Lee, Heui-Jae Pahk

Optics and Lasers in Engineering

EngineeringDisplay TechnologyMeasurementEducationReal-time ApplicationComputational ImagingCritical Dimension MeasurementImage ResolutionInstrumentationImage-processing Algorithm

References

	Year	Citations

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