Effect of high-temperature H2-anneals on the slow-trapping instability of MOS structures - Concepedia

Concepedia

Publication | Closed Access

Effect of high-temperature H2-anneals on the slow-trapping instability of MOS structures

22

Citations

10

References

1978

Year

A. K. Sinha, H. J. Levinstein, L. P. Adda, E.N. Fuls, E. I. Povilonis

Solid-State Electronics

Materials ScienceIi-vi SemiconductorTransition Metal ChalcogenidesEngineeringPhysicsNatural SciencesApplied PhysicsCondensed Matter PhysicsHigh-temperature H2-annealsMos StructuresSlow-trapping InstabilityQuantum ChemistryTopological Heterostructures

References

	Year	Citations

Page 1

Page 1