Journal of Applied Physics · 1944 · 163 citations · 4 references
EngineeringElectron MicroscopyPhysicsMicroscopyApplied PhysicsAtomic PhysicsMicroanalysisElectron Microscope
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Determination of Object Thickness in Electron Microscopy
L. Marton, L. I. Schiff · Journal of Applied Physics · 1941 · 78 citations · Full text
Engineering, Microscopy, Measurement +16
James Hillier · Physical Review · 1943 · 33 citations