Calibration and numerical simulation of Nanoparticle Surface Area Monitor (TSI Model 3550 NSAM) - Concepedia

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Calibration and numerical simulation of Nanoparticle Surface Area Monitor (TSI Model 3550 NSAM)

116

Citations

20

References

2006

Year

Weon Gyu Shin, David Y.H. Pui, S. Neumann, A. Trampe

Journal of Nanoparticle Research

Materials ScienceSurface CharacterizationTsi Model 3550EngineeringNanotechnologyCalibrationSurface ScienceNumerical SimulationApplied PhysicsNanostructured SurfaceSurface AnalysisNanometrologyInstrumentation

References

	Year	Citations

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