Publication | Closed Access
Photoresponse of the AsGa antisite defect in as-grown GaAs
72
Citations
14
References
1985
Year
Optical MaterialsEngineeringOptoelectronic DevicesEnergy HνSemiconductorsIi-vi SemiconductorElectron SpectroscopyOptical PropertiesAsga Antisite DefectCompound SemiconductorPhotoelectronic PropertiesPhotonicsPhotoluminescencePhysicsOptoelectronic MaterialsPhotoelectric MeasurementApplied PhysicsOptoelectronicsEl2 Defect
The photoresponse of the As+Ga antisite electron-paramagnetic-resonance (EPR) has been studied in as-grown semi-insulating GaAs as a function of illumination time and photon energy hν. The As+Ga EPR signal intensity changes are nonmonotonic in time in the range 1.1≲hν≲1.4 eV. The spectral dependences of As+Ga enhancement and quenching show distinct similarities with the EL2 optical cross sections σ0n (hν) and σ0p (hν), respectively. These results demonstrate that the EL2 defect and the AsGa antisite have practically identical optical and photoelectronic properties.
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