An ENDOR Spectrometer Using a Slow Wave Resonance System

Abstract

An ENDOR spectrometer is described that uses a microwave helix instead of a resonant cavity. With this arrangement, the sample can be irradiated simultaneously with large rf fields (15 G; 10–40 MHz) using a low power rf amplifier (10 W) and a microwave field (X band). Measurements have been performed on organic radicals at room temperature.