Applied Physics Letters · 2002 · 43 citations · 17 references
EngineeringMaterials EngineeringMaterials ScienceElectronic MaterialsSemiconductor MaterialsThin FilmsSemiconductor HeterostructuresSemiconductor InterfacesSemiconductor PhysicsSemiconductor Thin FilmsSolar Cell MaterialsSolar CellsBand AlignmentBand OffsetsDepth ProfilingSemiconductor CharacterizationSputter DepositionThin-film Solar CellsValence BandValence Band Structure
The band alignment at polycrystalline CdS/CdTe heterointerfaces for thin-film solar cells is determined by photoelectron spectroscopy from stepwise CdTe deposition on polycrystalline CdS substrates and from subsequent sputter depth profiling. Identical values of 0.94±0.05 eV for the valence band offset are obtained.
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