Semiconductive Polymer Blends: Correlating Structure with Transport Properties at the Nanoscale

Abstract

Multimodal atomic force microscopy (AFM) was used to map charge transfer properties in correlation to the molecular superstructure of poly(ethyldioxythiophene)–poly(styrenesulfonic acid) (see Figure). The lamellar domains of the polymer blend are indicated by phase shifts. Efficient charge injection occurs when lamellar edges of the superstructure are exposed to a conductive AFM probe. Efficiency of charge injection at polymer–electrode interfaces could be enhanced by controlling lamellar orientation.