Fast neutron radiation damage effects on high resistivity silicon junction detectors

MOS (Metal Oxide Semiconductor) Physics and Technology

K.J.S. Cave · IEE Proceedings I Solid State and Electron Devices · 1983 · 1.7K citations

Engineering, Chemical Engineering, Nuclear Engineering +12

Semiconductor drift chamber — An application of a novel charge transport scheme

E. Gatti, Pavel Řehák · Nuclear Instruments and Methods in Physics Research · 1984 · 761 citations · Full text

Engineering, Electrical Engineering, Materials Science +14

Conductance and capacitance studies in GaP Schottky barriers

G. Vincent, D. Bois, P. Pinard · Journal of Applied Physics · 1975 · 184 citations

Engineering, Electrical Engineering, Materials Science +17

Calorimetry in High-Energy Physics

C. Fabjan, T. Ludlam · Annual Review of Nuclear and Particle Science · 1982 · 172 citations · Full text

Engineering, Nuclear Engineering, Physics +14

Studies of frequency dependent C-V characteristics of neutron irradiated p/sup +/-n silicon detectors

Z. Li, H.W. Kraner · IEEE Transactions on Nuclear Science · 1991 · 51 citations · Full text

Engineering, Electrical Engineering, Materials Science +16