Publication | Open Access
Capabilities and limitations of LA-ICP-MS for depth resolved analysis of CdTe photovoltaic devices
31
Citations
22
References
2014
Year
Ii-vi SemiconductorElectrical EngineeringAnalytical PotentialEngineeringAnalytical InstrumentationSolar PowerCdte Photovoltaic DevicesSpectroscopyMulti-layer Cdte PhotovoltaicApplied PhysicsMass SpectrometryLaser-induced BreakdownPhotovoltaic SystemInstrumentationSpectrochemical AnalysisPhotovoltaicsSolar Cell Materials
The analytical potential of ArF* excimer Laser Ablation Inductively Coupled Plasma Mass Spectrometry (LA-ICP-MS) is investigated for fast qualitative depth profile analysis of multi-layer CdTe photovoltaic (PV) devices.
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