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Very low temperature TSC trap spectroscopy
11
Citations
9
References
1981
Year
Ii-vi SemiconductorLow Activation EnergiesElectrical EngineeringEngineeringPhysicsAtomic Emission SpectroscopyNatural SciencesSpectroscopyCryogenicsApplied PhysicsCondensed Matter PhysicsActivation Energy EtSemiconductor MaterialQuantum ChemistryInstrumentationOptoelectronicsDifferential Tsc SpectroscopyCompound Semiconductor
In a previous paper (1980) showed that differential TSC spectroscopy enables them to discriminate easily between a monomolecular and a bimolecular recombination process. It was also deduced that it leads to a correct evaluation of the coefficient X=Et/kTm relating the activation energy Et and the temperature Tm of the maximum (20<X<30). In the present work they examine the particular case of the TSC peaks lying at very low temperature (below 77K): the temperature dependence of the thermal velocity and of the density of states in the band introduce an important correction leading to values of X that can be lower than 10. The corresponding activation energies are then much lower than the values deduced from the usual Urbach's law. The experimental case of semi-insulating GaAs is studied: four overlapping peaks are found in the range 10-50K that could correspond to donors or acceptors impurities (10-50 meV). These low activation energies are confirmed by a fractional emptying experiment.
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