In Situ Synchrotron X-ray Diffraction Experiments on Electrochemically Deposited ZnO Nanostructures

Abstract

We present results of in situ synchrotron X-ray diffraction experiments on electrochemically formed ZnO nanostructured films during their growth on to Au substrates. This allows the evolution of texture to be monitored throughout the deposition process. The results are in good agreement with previous in situ X-ray absorption spectroscopy measurements of growth kinetics and indicate that strong preferred orientation, which is not evident from the microstructure, develops early in the growth process.