Publication | Closed Access
Accuracy of the emission-transmission method applied in XRF analysis of intermediate thickness samples
17
Citations
11
References
1992
Year
Emission-transmission MethodX-ray SpectroscopyEngineeringIntermediate Thickness SamplesCalibrationSpectroscopyX-ray DiffractionApplied PhysicsXrf AnalysisInstrumentationElemental CharacterizationX-ray OpticX-ray Fluorescence
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