An efficient interconnection unit composed of electron-transporting layer/metal/p-doped hole-transporting layer for tandem organic photovoltaics

Abstract

We report an efficient interconnection unit (ICU) consisting of an electron transporting layer/metal/p-doped hole transporting layer (p-HTL) structure for tandem organic photovoltaic (TOPV) cells. The ICU satisfies all the requirements of optical transparency and low voltage loss and for functioning as an optical spacer. The variation of the short circuit current and open circuit voltage (VOC) of the TOPV cells with increasing thickness of the p-HTL in the ICU followed the theoretical predictions, proving that the ICU does not disturb the electrical characteristics of the TOPV cells up to a p-HTL thickness of 100 nm with minimal VOC loss (∼3%).