Target backings for charged particle induced X-ray fluorescence analysis

X-ray analysis: Elemental trace analysis at the 10−12 g level

T. Johansson, Roland Akselsson, Sven Johansson · Nuclear Instruments and Methods · 1970 · 482 citations

Natural Sciences, Chemistry, Materials Science +9

Sensitivity versus target backings for elemental analysis by alpha excited X-ray emission

Robert G. Flocchini, Patrick Feeney, R.J. Sommerville et al. · Nuclear Instruments and Methods · 1972 · 60 citations

Natural Sciences, Chemistry, Earth Sciences +14

An investigation of the analytical capabilities of X-ray emission induced by high energy alpha particles

R. L. Watson, J.R. Sjurseth, R.W. Howard · Nuclear Instruments and Methods · 1971 · 50 citations

Natural Sciences, Physics, Radiology +16

Construction of efficiency curves for semiconductor X-ray spectrometers

J. L. Campbell, L.A. McNelles · Nuclear Instruments and Methods · 1972 · 47 citations

Engineering, Electrical Engineering, Radiation Detection +13