Sensitivity versus target backings for elemental analysis by alpha excited X-ray emission

X-ray analysis: Elemental trace analysis at the 10−12 g level

T. Johansson, Roland Akselsson, Sven Johansson · Nuclear Instruments and Methods · 1970 · 482 citations

Natural Sciences, Chemistry, Materials Science +9

An investigation of the analytical capabilities of X-ray emission induced by high energy alpha particles

R. L. Watson, J.R. Sjurseth, R.W. Howard · Nuclear Instruments and Methods · 1971 · 50 citations

Natural Sciences, Physics, Radiology +16

X-ray emission induced by 30 to 80 MeV alpha particles

R. L. Watson, C.W. Lewis, J. B. Natowitz · Nuclear Physics A · 1970 · 35 citations

Natural Sciences, Physics, Radiology +11

TRACE ELEMENT ANALYSIS BY X-RAY FLUORESCENCE

F.S. Goulding, J.M. Jaklevic · eScholarship (California Digital Library) · 1971 · 31 citations · Full text

Natural Sciences, Chemistry, Earth Sciences +10