Characterisation of a-C:H and oxygen-containing Si:C:H films by Raman spectroscopy and XPS

M. Vereš, M. Koóš, S. Tóth, Miklós Füle, I. Pócsik, A. Tóth, M. Mohai, I. Bertóti

Diamond and Related Materials · 2005 · 66 citations · 21 references

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References

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