Publication | Closed Access
Charge trapping memory structures with Al2O3 trapping dielectric for high-temperature applications
62
Citations
8
References
2005
Year
Materials ScienceHigh-temperature ApplicationsElectrical EngineeringEngineeringEmerging Memory TechnologyApplied PhysicsCondensed Matter PhysicsMemory DeviceSemiconductor MemoryMemory StructuresPhase Change MemoryElectrical Insulation
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