Metrology of multilayer Laue lens structures by means of scanning electron microscope imaging - Concepedia

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Metrology of multilayer Laue lens structures by means of scanning electron microscope imaging

10

Citations

19

References

2009

Year

Nima Jahedi, R. Conley, Bing Shi, Jun Qian, K. Lauer, Albert T. Macrander

Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment

Materials ScienceMultilayer LaueOptical MaterialsEngineeringElectron MicroscopyMicroscopyOptical PropertiesMicroscopy MethodSurface ScienceApplied PhysicsScanning Probe MicroscopyMicroanalysisElectron MicroscopeOptical SciencesOptical Components

References

	Year	Citations

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