Publication | Closed Access
Effect of layer thickness on structural quality of Ge epilayers grown directly on Si(001)
47
Citations
23
References
2011
Year
Materials ScienceMaterials EngineeringLayer ThicknessEpitaxial GrowthEngineeringApplied PhysicsStructural QualitySemiconductor Device FabricationElectronic PackagingSilicon On InsulatorMolecular Beam EpitaxyGe EpilayersChemical Vapor DepositionMicrostructure
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