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Selecting the tip electron orbital for scanning tunneling microscopy imaging with sub-ångström lateral resolution
36
Citations
30
References
2010
Year
NanosheetEngineeringSub-ångström Lateral ResolutionMicroscopyTip Electron OrbitalTunneling MicroscopyElectron MicroscopyMicroscopy MethodNanoelectronicsSpatial ResolutionMaterials SciencePhysicsTungsten Atomic OrbitalsTip Electron OrbitalsScanning Probe MicroscopySurface ScienceCondensed Matter PhysicsApplied PhysicsElectron Microscope
We report on scanning tunneling microscopy (STM) studies performed with single crystalline W[001] tips on a graphite(0001) surface. Results of distance-dependent STM experiments with sub-ångström lateral resolution and density functional theory electronic structure calculations show how to controllably select one of the tip electron orbitals for high-resolution STM imaging. This is confirmed by experimental images reproducing the shape of the 5dxz, yz and 5dx2−y2 tungsten atomic orbitals. The presented data demonstrate that the application of oriented single crystalline probes can provide further control of spatial resolution and expand the capabilities of STM.
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