A whole-system approach to x-ray spectroscopy in cargo inspection systems

Abstract

Views Icon Views Article contents Figures & tables Video Audio Supplementary Data Peer Review Share Icon Share Twitter Facebook Reddit LinkedIn Tools Icon Tools Reprints and Permissions Cite Icon Cite Search Site Citation Willem G. J. Langeveld, Tsahi Gozani, Peter Ryge, Shrabani Sinha, Tim Shaw, Dan Strellis; A whole-system approach to x-ray spectroscopy in cargo inspection systems. AIP Conference Proceedings 19 April 2013; 1525 (1): 690–697. https://doi.org/10.1063/1.4802416 Download citation file: Ris (Zotero) Reference Manager EasyBib Bookends Mendeley Papers EndNote RefWorks BibTex toolbar search Search Dropdown Menu toolbar search search input Search input auto suggest filter your search All ContentAIP Publishing PortfolioAIP Conference Proceedings Search Advanced Search |Citation Search