Applied Physics Letters · 1983 · 111 citations · 6 references
Natural SciencesMaterials EngineeringMaterials ScienceCrystal StructureSolid-state ChemistrySpectroscopyCrystal GrowthCrystalline MaterialsCrystallographyPhase IdentificationX-ray CrystallographyX-ray DiffractionCrystallinity DeterminationHigh-pressure Crystal GrowthPrecipitatesStructural Phase AnalysisX-ray Diffraction Analysis
Te precipitates in CdTe have been characterized by Auger spectroscopy, x-ray diffraction, and Raman spectroscopy. The x-ray results show that the precipitated Te in Bridgman-grown CeTe crystals has the same structural phase as observed in elemental Te under high pressure. Auger and Raman microprobe spectroscopy were carried out to confirm Te precipitates in CdTe and identify the symmetry of the Te precipitates.
6