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Determining the Causes of Spatial and Temporal Variability of Wheat Yields at Sub-field Scale Using a New Method of Upscaling a Crop Model

Precision AgricultureEngineeringWheat YieldsDroughtLand UseCrop ModelCropping SystemGeographyAgricultural EconomicsSub-field ScaleCrop Growth ModelingCrop YieldYield PredictionCrop ModellingSocial SciencesClimate Change