Publication | Closed Access
Low‐Temperature Atomic Layer Deposition of Copper Metal Thin Films: Self‐Limiting Surface Reaction of Copper Dimethylamino‐2‐propoxide with Diethylzinc
98
Citations
32
References
2009
Year
EngineeringThin Film Process TechnologyChemistryChemical DepositionNanoelectronicsMetallic Functional MaterialCopper Dimethylamino‐2‐propoxideAtomic Layer DepositionSurface ReactionThin Film ProcessingMaterials ScienceNanotechnologyCopper Thin FilmsNanomaterialsSurface ScienceApplied PhysicsThin FilmsChemical Vapor DepositionLigand Exchange
A uniform, conformal, pure copper metal thin film was grown at very low substrate temperatures (100-120 degrees C) on Si(100) substrates by atomic layer deposition involving the ligand exchange of [Cu(OCHMeCH(2)NMe(2))(2)] with Et(2)Zn (see scheme). Patterned copper thin films of Cu nanotubes (diameter 150 nm, length 12 microm) were fabricated.
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